Very high resolution chemical imaging with Infrared Scanning Near-field Optical Microscopy (IR-SNOM)

Dušan Vobornik; Giorgio Margaritondo; Slavenka Vobornik; Peter Thielen; Renato Generosi; Norman Tolk; Antononio Cricenti

doi:10.17305/bjbms.2004.3407

Authors

Dušan Vobornik Institut de Physique de la Matière Complexe, Ecole Polytechnique Fédérale
Giorgio Margaritondo Institut de Physique de la Matière Complexe, Ecole Polytechnique Fédérale
Slavenka Vobornik Optical Sciences Division, U.S. Naval Research Laboratory
Peter Thielen Istituto di stuttura della Materia
Renato Generosi Istituto di stuttura della Materia
Norman Tolk Department of Physics and Astronomy
Antononio Cricenti Department of Physics and Astronomy, Vanderbilt University

DOI:

https://doi.org/10.17305/bjbms.2004.3407

Keywords:

high resolution, chemical imaging, infrared scanning, near-field optical microscopy, IR-SNOM

Abstract

In this paper we present chemically highly resolved images obtained with Scanning Near-field Optical Microscopy (SNOM) coupled with an Infrared (IR) Free Electron Laser (FEL) at Vanderbilt University, Nashville, USA. Main principles governing SNOM imaging as well as essential components of the experimental setup are described. Chemically resolved images showing the distribution of different phases within the boron-nitride films are presented. Universal character of the experiment and its huge potential applications in biophysics and medical sciences domain are illustrated with highly resolved SNOM images of pancreatic cells.